• There are no items in your cart
We noticed you’re not on the correct regional site. Switch to our AMERICAS site for the best experience.
Dismiss alert

OIML R 98 : 1991

Current

Current

The latest, up-to-date edition.

HIGH-PRECISION LINE MEASURES OF LENGTH

Published date

12-01-2013

FOREWORD
1 General
2 Terminology
3 General technical requirements
4 Metrological requirements
5 Verification
6 Metrological controls
7 Packing

Pertains to rigid line measures of length of high precision, either single-valued or multiple-valued, on bars of metal or glass.

DocumentType
Standard
PublisherName
Organisation Internationale de Metrologie Legale
Status
Current

PD IEC/TS 62622:2012 Nanotechnologies. Description, measurement and dimensional quality parameters of artificial gratings
IEC TS 62622:2012 Nanotechnologies - Description, measurement and dimensional quality parameters of artificial gratings

View more information
Sorry this product is not available in your region.

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.