OVE EN IEC 60749-18: 2020 03 01
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The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods -- Part 18: Ionizing radiation (total dose) (( IEC 60749-18:2019) EN IEC 60749-18:2019) (english version)
Available format(s)
Hardcopy
Language(s)
English, German
Published date
01-03-2020
This part of IEC 60749 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source.
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