PD IEC/TR 63133:2017
Current
Current
The latest, up-to-date edition.
Semiconductor devices. Scan based ageing level estimation for semiconductor devices
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
29-01-2018
Publisher
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and abbreviated terms
4 Ageing level
Bibliography
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