SEMI MF28:2017(R2022)
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Test Method for Minority Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductivity Decay
Available format(s)
Hardcopy
Language(s)
English
Published date
01-06-2022
Minority carrier lifetime is one of the essential characteristics of semiconductor materials. Many metallic impurities form recombination centers in germanium and silicon; in many cases, these recombination centers are deleterious to device and circuit performance.
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