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SNV
SN EN 60749-17 : 2003

SN EN 60749-17 : 2003

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 17: NEUTRON IRRADIATION

Published date

12-01-2013

Publisher

Swiss Standards

Foreword
1 Scope and object
2 Test apparatus
3 Procedure
4 Summary

Performed to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

DocumentType
Standard
PublisherName
Swiss Standards
Status
Current

Standards Relationship
DIN EN 60749-17:2003-09 Identical
IEC 60749-17:2003 Identical
BS EN 60749-17:2003 Identical
I.S. EN 60749-17:2003 Identical
UNE-EN 60749-17:2003 Identical
EN 60749-17:2003 Identical

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