Name: SN EN 60749-32 : 2003
Brand: SNV

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 32: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (EXTERNALLY INDUCED)

Published date

12-01-2013

Publisher

Swiss Standards

Foreword INTRODUCTION 1 Scope and object 2 Normative references 3 Test procedure Annex ZA (normative) Normative references to international          publications with their corresponding European          publications

Applies to semiconductor devices (discrete devices and integrated circuits). It determines whether the device ignites due to external heating.

DocumentType	Standard
PublisherName	Swiss Standards
Status	Current

Standards	Relationship
IEC 60749-32:2002+AMD1:2010 CSV	Identical
DIN EN 60749-32:2011-01	Identical
I.S. EN 60749-32:2003	Identical
UNE-EN 60749-32:2004	Identical
EN 60749-32:2003/A1:2010	Identical
NF EN 60749-32 : 2003 AMD 1 2011	Identical
BS EN 60749-32 : 2003	Identical
NBN EN 60749-32 : 2004 AMD 1 2010	Identical

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SN EN 60749-32 : 2003

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 32: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (EXTERNALLY INDUCED)

Table of Contents

Abstract

General Product Information

International Equivalents

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