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SN EN 62047-25 : 2016

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 25: SILICON-BASED MEMS FABRICATION TECHNOLOGY - MEASUREMENT METHOD OF PULL-PRESS AND SHEARING STRENGTH OF MICRO BONDING AREA

Available format(s)

Hardcopy

Language(s)

German, English - French

Published date

01-11-2016

Committee
TK 64
DocumentType
Standard
Pages
0
PublisherName
Swiss Standards
Status
Current

Standards Relationship
EN 62047-25:2016 Identical
IEC 62047-25:2016 Identical

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£63.22
Excluding VAT

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