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SNV
SN EN ISO 9220 : 1995

SN EN ISO 9220 : 1995

Current

Current

The latest, up-to-date edition.

METALLIC COATINGS - MEASUREMENT OF COATING THICKNESS - SCANNING ELECTRON MICROSCOPE METHOD

Published date

12-01-2013

Publisher

Swiss Standards

National foreword
Committees responsible
Method
1. Scope
2. Normative references
3. Definition
4. Principle
5. Instrumentation
6. Factors influencing the measurement results
7. Preparation of cross-sections
8. Calibration of instruments
9. Procedure
10. Measurement uncertainty
11. Expression of results
12. Test report
Annex
A. General guidance on the preparation and
     measurement of cross-sections

Uses scanning electron microscope to examine cross sections of metallic coatings to measure thickness.

DocumentType
Standard
PublisherName
Swiss Standards
Status
Current

Standards Relationship
I.S. EN ISO 9220:1995 Identical
ISO 9220:1988 Identical
BS EN ISO 9220:1995 Identical
EN ISO 9220 : 1994 Identical
DIN EN ISO 9220:1995-01 Identical
DIN EN ISO 9220 E : 1995 Identical
UNE-EN ISO 9220:1996 Identical
UNI EN ISO 9220 : 1998 Identical
NF EN ISO 9220 : 1995 Identical

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