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UNE-EN 60749-34:2011

Current

Current

The latest, up-to-date edition.

Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling

Available format(s)

Hardcopy , PDF

Language(s)

Spanish, Castilian, English

Published date

20-07-2011

Committee
CTN 209/SC 47
DocumentType
Standard
Pages
16
PublisherName
Asociacion Espanola de Normalizacion
Status
Current
Supersedes

Standards Relationship
NF EN 60749-34 : 2011 Identical
IEC 60749-34:2010 Identical
NBN EN 60749-34 : 2011 Identical
I.S. EN 60749-34:2010 Identical
BS EN 60749-34:2010 Identical
EN 60749-34:2010 Identical
DIN EN 60749-34:2011-05 Identical

EN 60749-23:2004/A1:2011 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 23: HIGH TEMPERATURE OPERATING LIFE
IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
IEC 60749-3:2017 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
EN 60749-3:2017 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
IEC 60747-6:2016 Semiconductor devices - Part 6: Discrete devices - Thyristors
IEC 60747-2:2016 Semiconductor devices - Part 2: Discrete devices - Rectifier diodes
IEC 60749-23:2004+AMD1:2011 CSV Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

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