IEC 60068-1:2013
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Environmental testing - Part 1: General and guidance
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IEC 60068-2-58:2015+AMD1:2017 CSV
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Environmental testing - Part 2-58: Tests - Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD)
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IEC 60068-2-27:2008
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Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
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IEC 60068-2-20:2008
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Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
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IEC 61837-1:2012
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Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
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IEC 60679-4:1997
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Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval
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IEC 60068-2-21:2006
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Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
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IEC 60068-2-13:1983
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Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure
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IEC 61837-2:2011+AMD1:2014 CSV
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Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part2: Ceramic enclosures
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IEC 60679-5:1998
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Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval
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IEC 61837-4:2015
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Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines
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IEC 60749-27:2006+AMD1:2012 CSV
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Semiconductor devices - Mechanical and climatic test methods - Part27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
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IEC 61019-1:2004
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Surface acoustic wave (SAW) resonators - Part 1: Generic specification
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IEC 60068-2-31:2008
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Environmental testing - Part 2-31: Tests - Test Ec: Rough handling shocks, primarily for equipment-type specimens
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IEC 60068-2-64:2008
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Environmental testing - Part 2-64: Tests - Test Fh: Vibration, broadband random and guidance
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IEC 60469-1:1987
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Pulse techniques and apparatus. Part 1: Pulse terms and definitions
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IEC 60410:1973
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Sampling plans and procedures for inspection by attributes
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IEC GUIDE 102:1996
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Electronic components - Specification structures for qualityassessment (Qualification approval and capability approval)
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IEC 61019-2:2005
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Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
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IEC 60749-26:2013
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Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
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IEC 60068-2-17:1994
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Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
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IEC 60068-2-10:2005
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Environmental testing - Part 2-10: Tests - Test J and guidance: Mould growth
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IEC 60068-2-2:2007
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Environmental testing - Part 2-2: Tests - Test B: Dry heat
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IEC 60050-561:2014
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International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
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IEC 60122-1:2002
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Quartz crystal units of assessed quality - Part 1: Generic specification
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IEC 60748-2:1997
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Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
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IEC 60068-2-1:2007
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Environmental testing - Part 2-1: Tests - Test A: Cold
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IEC 60679-3:2012
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Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
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IEC 60679-2:1981
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Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
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IEC 60068-2-14:2009
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Environmental testing - Part 2-14: Tests - Test N: Change of temperature
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IEC 60679-1:2017
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Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
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IEC 60068-2-52:2017
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Environmental testing - Part 2-52: Tests - Test Kb: Salt mist, cyclic (sodium chloride solution)
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IEC 60068-2-30:2005
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Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)
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