IEC 60122-1:2002

Superseded

View Superseded by

Quartz crystal units of assessed quality - Part 1: Generic specification

Amended by

IEC 60122-1:2002/AMD1:2017

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Superseded date

12-09-2019

Language(s)

English - French

Published date

08-09-2002

Publisher

International Electrotechnical Committee

Specifies the methods of test and general requirements for quartz crystal units of assessed quality using either capability approval or qualification approval procedures.

Committee	TC 49
DocumentType	Standard
Pages	105
ProductNote	NEW CHILD AMD 1 2017 IS NOW ADDED.
PublisherName	International Electrotechnical Committee
Status	Superseded
SupersededBy	IEC 60122-1:2002+AMD1:2017 CSV
Supersedes	IEC 60122-1:1976 IEC 60302:1969 IEC 61178-1:1993 IEC 60122-1:1976/AMD1:1983

Standards	Relationship
UNE-EN 60122-1:2002	Identical
I.S. EN 60122-1:2002 AMD 1 2018	Identical
NEN EN IEC 60122-1 : 2003	Identical
CEI EN 60122-1 : 2004	Identical
GOST R IEC 60122-1 : 2009	Identical
NF EN 60122-1 : 2003	Identical
JIS C 6701:2007	Identical
OVE/ONORM EN 60122-1 : 2003	Identical
DIN EN 60122-1:2003-06	Identical
BS EN 60122-1 : 2002	Identical
PN EN 60122-1 : 2006	Identical

IEC 63041-2:2017	Piezoelectric sensors - Part 2: Chemical and biochemical sensors
BS EN 168200:1996	Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (qualification approval)
BS EN 60862-1:2015	Surface acoustic wave (SAW) filters of assessed quality Generic specification
12/30258507 DC : 0	BS EN 62575-1 - RADIO FREQUENCY (RF) BUK ACOUSTIC WAVE (BAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
BS EN 62575-1:2016	Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality Generic specification
13/30280840 DC : 0	BS EN 60758 - SYNTHETIC QUART CRYSTAL - SPECIFICATIONS AND GUIDELINES FOR THE USE
03/108947 DC : DRAFT MAY 2003	IEC 60758 ED.3 - SYNTHETIC QUARTZ CRYSTAL - SPECIFICATIONS AND GUIDE TO THE USE
15/30325282 DC : 0	BS EN 62884-1 - MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELETIRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT
10/30240248 DC : 0	BS EN 60862-1 - SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
17/30358131 DC : 0	BS IEC 60122-4 ED.1.0 - QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 4: CRYSTAL UNITS WITH THERMISTORS
BS EN 62884-1:2017	Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Basic methods for the measurement
NF EN 60444-11 : 2011	MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 11: STANDARD METHOD FOR THE DETERMINATION OF THE LOAD RESONANCE FREQUENCY FL AND THE EFFECTIVE LOAD CAPACITANCE CLEFF USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION
I.S. EN 168000:1994	QUARTZ CRYSTAL UNITS (GENERIC SPECIFICATION)
I.S. EN 60689:2009	MEASUREMENT AND TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 KHZ TO 200 KHZ AND STANDARD VALUES
CEI EN 60689 : 2009	MEASUREMENT AND TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 KHZ TO 200 KHZ AND STANDARD VALUES
I.S. EN 60444-8:2017	MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 8: TEST FIXTURE FOR SURFACE MOUNTED QUARTZ CRYSTAL UNITS
I.S. EN IEC 63041-1:2018	PIEZOELECTRIC SENSORS - PART 1: GENERIC SPECIFICATIONS
EN IEC 63041-1:2018	Piezoelectric sensors - Part 1: Generic specifications
I.S. EN 62575-1:2016	RADIO FREQUENCY (RF) BULK ACOUSTIC WAVE (BAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
IEC 60122-3:2010	Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
EN 61019-1 : 2005	Surface acoustic wave (SAW) resonators - Part 1: Generic specification
EN 60444-8:2017	Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
EN 60689:2009	Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
EN 60758:2016	Synthetic quartz crystal - Specifications and guidelines for use
EN 62604-1:2015	Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
EN 60027-2:2007	Letter symbols to be used in electrical technology - Part 2: Telecommunications and electronics
OVE/ONORM EN 60027-2 : 2007	LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - PART 2: TELECOMMUNICATIONS AND ELECTRONICS
MIL-PRF-3098 Revision L:2017	CRYSTAL UNITS, QUARTZ, GENERAL SPECIFICATION FOR
BS EN 60027-2:2007	Letter symbols to be used in electrical technology Telecommunications and electronics
14/30282293 DC : 0	BS EN 60679-1 - PIEZOELECTRIC AND ASSOCIATED MATERIAL OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
I.S. EN 62604-1:2015	SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
I.S. EN 61019-1:2005	SURFACE ACOUSTIC WAVE (SAW) RESONATORS - PART 1: GENERIC SPECIFICATION
EN 62884-1:2017	Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
I.S. EN 60027-2:2007	LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - PART 2: TELECOMMUNICATIONS AND ELECTRONICS
I.S. EN 60122-3:2010	QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 3: STANDARD OUTLINES AND LEAD CONNECTIONS
IEC 60444-8:2016	Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
IEC TS 61994-1:2007	Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators
BS EN 60122-3:2010	Quartz crystal units of assessed quality Standard outlines and lead connections
BS EN 61019-1:2005	Surface acoustic wave (SAW) resonators Generic specification
BS EN 60679-1:2017	Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification
07/30161553 DC : 0	BS EN 60758 - SYNTHETIC QUARTZ CRYSTAL - SPECIFICATIONS AND GUIDE TO THE USE
BIS IS/IEC 60862-1 : 2003	SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
BS EN 168000:1996	Harmonized system of quality assessment for electronic components. Generic specification: quartz crystal units
I.S. EN 60679-1:2017	PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
I.S. EN IEC 63041-2:2018	PIEZOELECTRIC SENSORS - PART 2: CHEMICAL AND BIOCHEMICAL SENSORS
IEC 63041-1:2017	Piezoelectric sensors - Part 1: Generic specifications
I.S. EN 62884-1:2017	MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT
IEC 60679-1:2017	Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
IEC 60027-2:2005	Letter symbols to be used in electrical technology - Part 2: Telecommunications and electronics
IEC 62575-1:2015	Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification
EN 60444-11:2010	Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
CEI EN 60758 : 2010	SYNTHETIC QUARTZ CRYSTAL - SPECIFICATIONS AND GUIDELINES FOR USE
BS EN 62604-1:2015	Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification
BS EN 60689:2009	Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
08/30180527 DC : DRAFT JULY 2008	BS EN 60444-11 - MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 11: STANDARD METHOD FOR THE DETERMINATION OF THE LOAD RESONANCE FREQUENCY FL AND THE EFFECTIVE LOAD CAPACITANCE CLEFF USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION
12/30252220 DC : DRAFT MAR 2012	BS EN 62604-1 - SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS - PART 1: GENERIC SPECIFICATION
BS EN 60758:2016	Synthetic quartz crystal. Specifications and guidelines for use
BS EN 60444-11:2010	Measurement of quartz crystal unit parameters Standard method for the determination of the load resonance frequency ƒL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
BS EN 60444-8:2017	Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units
CEI EN 60444-11 : 2011	MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 11: STANDARD METHOD FOR THE DETERMINATION OF THE LOAD RESONANCE FREQUENCY F[L] AND THE EFFECTIVE LOAD CAPACITANCE C[LEFF] USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION
13/30283831 DC : 0	BS EN 60444-8:2003+A1 - MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 8: TEST FIXTURE FOR SURFACE MOUNTED QUARTZ CRYSTAL UNITS
NF EN 60027-2 : 2007	LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - PART 2: TELECOMMUNICATIONS AND ELECTRONICS
EN 60679-1:2017	Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
ISO 17859:2015	Fine ceramics (advanced ceramics, advanced technical ceramics) Measurement method of piezoelectric strain at high electric field
EN IEC 63041-2:2018	Piezoelectric Sensors - Part 2: Chemical and Biochemical Sensors
IEC 62604-1:2015	Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
IEC 60689:2008	Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
IEC 60862-1:2015	Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
IEC 61019-1:2004	Surface acoustic wave (SAW) resonators - Part 1: Generic specification
EN 60862-1:2015	Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
09/30200785 DC : 0	BS EN 60122-3 - QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 3: STANDARD OUTLINES AND LEAD CONNECTIONS
I.S. EN 60758:2016	SYNTHETIC QUARTZ CRYSTAL - SPECIFICATIONS AND GUIDELINES FOR USE
11/30243576 DC : DRAFT FEB 2011	BS EN 62643-1 - ELECTROSTATIC MICRO ELECTRO MECHANICAL SYSTEMS (MEMS) OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
BS ISO 17859:2015	Fine ceramics (advanced ceramics, advanced technical ceramics). Measurement method of piezoelectric strain at high electric field
DD IEC/TS 61994-1:2007	Piezoelectric and dielectric devices for frequency control and selection. Glossary Piezoelectric and dielectric resonators
I.S. EN 60862-1:2015	SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
IEC 62884-1:2017	Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
IEC 60758:2016	Synthetic quartz crystal - Specifications and guidelines for use
I.S. EN 60444-11:2010	MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 11: STANDARD METHOD FOR THE DETERMINATION OF THE LOAD RESONANCE FREQUENCY F[L] AND THE EFFECTIVE LOAD CAPACITANCE C[LEFF] USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION
IEC 60444-11:2010	Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency f<sub>L</sub> and the effective load capacitance C<sub>Leff</sub> using automatic network analyzer techniques and error correction
EN 60122-3:2010	Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
EN 62575-1:2016	Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification