Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English, English - French

Published date

10-07-2010

Publisher

International Electrotechnical Committee

IEC 60444-11:2010 defines the standard method of measuring load resonance frequency fL at the nominal value of CL, and the determination of the effective load capacitance CLeff at the nominal frequency for crystals with the figure of merit M > 4.

Committee	TC 49
DevelopmentNote	Stability Date: 2017. (09/2017)
DocumentType	Standard
Pages	32
PublisherName	International Electrotechnical Committee
Status	Current

Standards	Relationship
NF EN 60444-11 : 2011	Identical
NBN EN 60444-11 : 2011	Identical
NEN EN IEC 60444-11 : 2011	Identical
I.S. EN 60444-11:2010	Identical
PN EN 60444-11 : 2011	Identical
UNE-EN 60444-11:2010	Identical
BS EN 60444-11:2010	Identical
CEI EN 60444-11 : 2011	Identical
EN 60444-11:2010	Identical
DIN EN 60444-11:2011-06	Identical

IEC 60444-5:1995	Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
IEC TR 60444-4:1988	Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz
IEC 60122-1:2002	Quartz crystal units of assessed quality - Part 1: Generic specification