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EN 60689:2009

Current

Current

The latest, up-to-date edition.

Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values

Published date

03-27-2009

1 Scope
2 Normative references
3 Overview
  3.1 General
  3.2 Applied frequency range
  3.3 Measurement method
  3.4 Load capacitance
  3.5 Recommended drive level
  3.6 Measurement conditions
  3.7 Measurement of frequency-temperature
      characteristics
  3.8 Load capacitance frequency characteristics
4 Measurement methods
  4.1 Method A
      4.1.1 Vector network analyzer/vector impedance
            analyzer
      4.1.2 Block diagram
      4.1.3 Specifications for vector network
             analyzer/vector impedance analyzer
      4.1.4 Test fixture
      4.1.5 Measurement of equivalent circuit
            constants
      4.1.6 Frequency pulling
  4.2 Method B
      4.2.1 General
      4.2.2 Block diagram
      4.2.3 Calibration
      4.2.4 Procedure
5 Measurement conditions
  5.1 General
  5.2 Measurement conditions
  5.3 Measurement of the frequency-temperature
      dependence
      5.3.1 General
      5.3.2 Block diagram
      5.3.3 Determination of the turnover point and
            parabolic coefficient beta (standard
            reference method)
      5.3.4 Measurement of the frequency versus
            temperature characteristics (mass
            production method)
      5.3.5 Frequency C[L] curve
6 Test and environmental examination
  6.1 Application of the definition of IEC 60122-1
  6.2 Magnetism - Influence of a magnetic field on the
      frequency
  6.3 Enclosure
  6.4 Measuring conditions and electric performance
      6.4.1 General
      6.4.2 Measurement conditions
      6.4.3 Standard values
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

IEC 60689:2008(E) applies to measurements and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values for frequency control and selection. This second edition cancels and replaces the first edition published in 1980. This edition constitutes a technical revision. It includes the following significant technical changes with respect to the previous edition: a) The title of the first edition is Measurements and test methods for 32 kHz quartz crystal units for wrist watches and standard values. The title is modified and the frequency range of this second edition is extended to the range from 10 kHz to 200 kHz. b) The Lissajous method is defined in the first edition as the standard measurement method. The PI network and bridge method are used in this second edition. c) The PI network has a transformer for impedance matching. This composition differs from that of IEC 60444-1.

Committee
CLC/SR 49
DocumentType
Standard
PublisherName
European Committee for Standards - Electrical
Status
Current

Standards Relationship
CEI EN 60689 : 2009 Identical
BS EN 60689:2009 Identical
I.S. EN 60689:2009 Identical
PN EN 60689 : 2009 Identical
NEN EN IEC 60689 : 2009 Identical
NBN EN 60689 : 2009 Identical
DIN EN 60689:2009-08 Identical
IEC 60689:2008 Identical
NF EN 60689 : 2014 Identical
UNE-EN 60689:2009 Identical
BS EN 60127-1:2006+A2:2015 Identical

IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
IEC 60122-3:2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
IECQ 001002-3:2005 IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 3: APPROVAL PROCEDURES
IEC 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
IEC 60068-2-13:1983 Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure
IEC 61178-3:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval
IECQ 001002-2:1998 IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 2: DOCUMENTATION
IEC 60068-2-31:2008 Environmental testing - Part 2-31: Tests - Test Ec: Rough handling shocks, primarily for equipment-type specimens
IEC Q 01 : 5.0 IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ SYSTEM) - BASIC RULES
Q C 001005 : 1995 REGISTER OF FIRMS, PRODUCTS AND SERVICES APPROVED UNDER THE IECQ SYSTEM, INCLUDING ISO 900
IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
IEC 60050-561:2014 International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
IEC 60122-1:2002 Quartz crystal units of assessed quality - Part 1: Generic specification
IEC 61178-2:1993 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval
IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
EN 60122-3:2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)

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