IEC 60122-3:2010
Current
The latest, up-to-date edition.
Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English, English - French
10-11-2010
IEC 60122-3:2010 specifies the outline drawing for quartz crystal units with lead enclosures. The main changes with respect to the previous edition are as follows: 12 of the 48 enclosure types contained in the previous edition have been deleted.
Committee |
TC 49
|
DevelopmentNote |
Supersedes IEC 60122-3A, IEC 60122-3B, IEC 60122-3C and IEC 60122-3D. (07/2004) Stability Date: 2017. (09/2017)
|
DocumentType |
Standard
|
Pages |
52
|
PublisherName |
International Electrotechnical Committee
|
Status |
Current
|
Supersedes |
Standards | Relationship |
DIN EN 60122-3:2011-08 | Identical |
NBN EN 60122-3 : 2011 | Identical |
NEN EN IEC 60122-3 : 2011 | Identical |
I.S. EN 60122-3:2010 | Identical |
PN EN 60122-3 : 2011 | Identical |
CEI EN 60122-3 : 2016 | Identical |
EN 60122-3:2010 | Identical |
NF EN 60122-3 : 2011 | Identical |
DIN 45110-20:1981-06 | Similar to |
DIN 45110-13:1981-06 | Similar to |
DIN 45110-22:1981-06 | Similar to |
DIN IEC 60122-3:1993-09 | Identical |
DIN 45110-11:1981-06 | Similar to |
DIN 45110-1 : 1981 | Similar to |
DIN 45110-17:1981-06 | Similar to |
NEN 10122-3 : 1985 | Identical |
DIN 45110-27 : 1981 | Similar to |
DIN 45110-25 : 1981 | Similar to |
DIN 45110-18:1981-06 | Similar to |
DIN IEC 60122-2:1993-09 | Corresponds |
DIN 45110-23:1981-06 | Similar to |
DIN 45110-24:1981-06 | Similar to |
BS 5069-1:1980 | Identical |
UNE-EN 60122-3:2010 | Identical |
DIN 45110-28:1981-06 | Similar to |
DIN 45110-16:1981-06 | Similar to |
DIN 45110-21:1981-06 | Similar to |
BS EN 60122-3:2010 | Identical |
DIN 45110-15:1981-06 | Similar to |
DIN 45110-26:1981-06 | Similar to |
I.S. EN 61837-3:2015 | SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 3: METAL ENCLOSURES |
BS CECC68000(1990) : AMD 9184 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION: QUARTZ CRYSTAL UNITS |
I.S. EN 60689:2009 | MEASUREMENT AND TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 KHZ TO 200 KHZ AND STANDARD VALUES |
CEI EN 60689 : 2009 | MEASUREMENT AND TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 KHZ TO 200 KHZ AND STANDARD VALUES |
EN 61837-2:2011/A1:2014 | SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES (IEC 61837-2:2011/A1:2014) |
NF EN 60122-1 : 2003 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
EN 61837-3:2015 | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures |
EN 60689:2009 | Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values |
EN 168000 : 1993 AMD 2 1998 | GENERIC SPECIFICATION - QUARTZ CRYSTAL UNITS |
I.S. EN 168000:1994 | QUARTZ CRYSTAL UNITS (GENERIC SPECIFICATION) |
IEC 61837-3:2015 | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures |
09/30200395 DC : 0 | BS EN 61837-2 ED. 2 - SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES |
13/30278807 DC : 0 | BS EN 61837-3 - SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTI0N - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 3: METAL ENCLOSURE |
BS EN 168000:1996 | Harmonized system of quality assessment for electronic components. Generic specification: quartz crystal units |
IEC 61178-3-1:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval - Section 1: Blank detail specification |
BS EN 60689:2009 | Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values |
I.S. EN 61837-2:2011 | SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES |
BS EN 60122-1 : 2002 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
IEC 61178-1:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 1: Generic specification |
BS EN 61837-3:2015 | Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Metal enclosures |
IEC 61178-2-1:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval - Section 1: Blank detail specification |
IEC 60689:2008 | Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values |
I.S. EN 60122-1:2002 AMD 1 2018 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
CEI EN 60122-1 : 2004 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
BS EN 61837-2 : 2011 | SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES |
EN 60122-1:2002/A1:2018 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION (IEC 60122-1:2002/A1:2017) |
ISO 1101:2017 | Geometrical product specifications (GPS) — Geometrical tolerancing — Tolerances of form, orientation, location and run-out |
IEC 61178-3:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval |
IEC 61178-3-1:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval - Section 1: Blank detail specification |
IEC 60122-2:1983 | Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection |
IEC 60122-1:2002 | Quartz crystal units of assessed quality - Part 1: Generic specification |
IEC 61178-2:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval |
IEC 61178-2-1:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval - Section 1: Blank detail specification |
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.