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BS EN 60444-8:2017

BS EN 60444-8:2017

Current

Current

The latest, up-to-date edition.

Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

05-26-2017

Publisher

British Standards Institution

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Specifications
4 Leadless surface mounted quartz crystal units
5 Specifications of measurement method, test fixture
6 Calibration
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

Defines test fixtures suitable for leadless surface mounted quartz crystal units in enclosures as defined in IEC 61837 (all parts).

This part of IEC 60444 describes test fixtures suitable for leadless surface mounted quartz crystal units in enclosures as defined in IEC 61837 (all parts). These fixtures allow the measurement of (series) resonance frequency, (series) resonance resistance, and equivalent electrical circuit parameters L1, C1 and C0 using the measurement techniques specified in IEC 60444-5 and for the determination of load resonance frequency and load resonance resistance according to IEC TR 60444-4 and IEC 60444-11.

Two test fixtures are described in this document:

  1. A fixture using the π-network circuit with electrical values as described in IEC 60444-1 for measurements in transmission mode up to 500 MHz. This fixture includes optional means to add physical load capacitors for the measurement of load resonance parameters up to 30 MHz in accordance with IEC 60444-4. The range of load capacitance is 10 pF or more. Calibration of the measurement system and CL adapter board is explained hereinafter.

  2. A fixture based on the reflection method, suitable for a frequency range up to 1 200 MHz. No provisions for adding a physical load capacitance are anticipated. Load resonance parameters can be measured by using the method of IEC 60444-11.

Committee
W/-
DevelopmentNote
Supersedes BS PD IEC/PAS 62277 and 01/208154 DC (11/2003) Supersedes 13/30283831 DC. (05/2017)
DocumentType
Standard
Pages
22
PublisherName
British Standards Institution
Status
Current
Supersedes

Standards Relationship
EN 60793-2-50:2008 Identical
IEC 60793-2-50:2008 Identical
SN EN 60444-8 : 2017 Identical
IEC 60444-8:2016 Identical
NBN EN 60444-8 : 2003 Identical
I.S. EN 60444-8:2017 Identical
NF EN 60444-8 : 2017 Identical
EN 60444-8:2017 Identical
DIN EN 60444-8:2004-03 Identical

EN 61837-3:2015 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures
IEC 61837-1:2012 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
EN 60444-2:1997 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
IEC 60444-5:1995 Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
IEC 61837-2:2011+AMD1:2014 CSV Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part2: Ceramic enclosures
IEC 60444-2:1980 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
IEC 60444-6:2013 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
EN 60444-1:1997/A1:1999 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK - PART 1: BASIC METHOD FOR THE MEASUREMENT OF RESONANCE FREQUENCY AND RESONANCE RESISTANCE OF QUARTZ CRYSTAL UNITS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK
IEC 61837-3:2015 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures
EN 60444-6:2013 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
EN 60444-7:2004 Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
IEC 60444-9:2007 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
EN 61837-1:2012 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
EN 60444-9:2007 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
IEC 60444-7:2004 Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
IEC 60122-1:2002 Quartz crystal units of assessed quality - Part 1: Generic specification
EN 60444-5:1997 Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
EN 61837-2:2011/A1:2014 SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES (IEC 61837-2:2011/A1:2014)

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