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IEC 60444-7:2004

Current

Current

The latest, up-to-date edition.

Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English, English - French

Published date

04-05-2004

IEC 60444-7:2004 applies to activity and frequency dips for quartz crystal units over a temperature range.

Committee
TC 49
DevelopmentNote
A Bilingual edition has been published. (05/2013) Stability Date: 2017. (09/2017)
DocumentType
Standard
Pages
8
PublisherName
International Electrotechnical Committee
Status
Current

Standards Relationship
NF EN 60444-7 : 2004 Identical
NEN EN IEC 60444-7 : 2004 Identical
PN EN 60444-7 : 2005 Identical
SAC GB/T 22319-7 : 2015 Identical
UNE-EN 60444-7:2004 Identical
BS EN 60444-7:2004 Identical
CEI EN 60444-7 : 2005 Identical
EN 60444-7:2004 Identical
DIN EN 60444-7:2004-11 Identical

I.S. EN 60444-8:2017 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 8: TEST FIXTURE FOR SURFACE MOUNTED QUARTZ CRYSTAL UNITS
EN 60444-8:2017 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
IEC 60444-8:2016 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
BS EN 60444-8:2017 Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units

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