PD IEC/PAS 62277:2002

Superseded

View Superseded by

Test-fixture of surface mounting quartz crystal units

Available format(s)

Hardcopy , PDF

Superseded date

11-19-2003

Language(s)

English

Published date

02-01-2002

Publisher

British Standards Institution

1 Introduction
2 Scope
3 Application
4 General issue
5 Leadless surface mounting quartz crystal units
   5.1 Enclosure
   5.2 Overtone and frequency range
6 Specifications of measurement method, test-fixture
   6.1 Specifications of measurement method
   6.2 Specifications of test-fixture
7 Calibration of measurement system and C[L] adapter board
   7.1 Calibration of measurement system
   7.2 Calibration of C[L] adapter board
Reference

Defines the test-fixture that allows the accurate measurement of resonance frequency, resonance resistance, and electrical-equivalent-circuit constants of a leadless surface mounting quartz crystal units using the zero phase technique as specified in IEC 60444-4 [4] and IEC 60444-5.

Describes the test-fixture that allows the accurate measurement of resonance frequency, resonance resistance, and electrical-equivalent-circuit constants of a leadless surface mounting quartz crystal using the zero phase technique as specified in IEC 60444.

Committee	W/-
DevelopmentNote	Also numbered as IEC PAS 62277. (02/2002)
DocumentType	Standard
Pages	16
PublisherName	British Standards Institution
Status	Superseded
SupersededBy	BS EN 60444-8:2017 BS EN 60444-8:2003