Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French, Russian

Published date

01-01-1980

Publisher

International Electrotechnical Committee

Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.

Committee	TC 49
DevelopmentNote	Also numbered as BS EN 60444-2 (11/2005) Stability Date: 2017. (09/2017)
DocumentType	Standard
Pages	18
PublisherName	International Electrotechnical Committee
Status	Current

Standards	Relationship
PN IEC 444-2 : 1996	Identical
EN 60444-2:1997	Identical
NEN EN IEC 60444-2 : 1997	Identical
NEN 10444-2 : 1982	Identical
DIN EN 60444-2:1997-10	Identical
NF EN 60444-2 : 2001	Identical
DIN IEC 60444-2:1992-11	Identical
SN EN 60444-2 : 1997	Identical
BS 7681-2(1993) : 1993 AMD 9658	Similar to
I.S. EN 60444-2:1999	Identical
UNE-EN 60444-2:1997	Identical

BS CECC68000(1990) : AMD 9184	HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION: QUARTZ CRYSTAL UNITS
I.S. EN 168000:1994	QUARTZ CRYSTAL UNITS (GENERIC SPECIFICATION)
I.S. EN 60444-8:2017	MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 8: TEST FIXTURE FOR SURFACE MOUNTED QUARTZ CRYSTAL UNITS
NF EN 60122-1 : 2003	QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
EN 60444-8:2017	Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
EN 168000 : 1993 AMD 2 1998	GENERIC SPECIFICATION - QUARTZ CRYSTAL UNITS
IEC 60444-8:2016	Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
BS EN 168000:1996	Harmonized system of quality assessment for electronic components. Generic specification: quartz crystal units
CEI EN 60122-1 : 2004	QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
BS EN 60122-1 : 2002	QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
IEC 61178-1:1993	Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 1: Generic specification
BS EN 60444-8:2017	Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units
DIN IEC 60444-4:1992-11	MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE TECHNIQUE IN A PI NETWORK; METHOD FOR THE MEASUREMENT OF LOAD RESONANCE FREQUENCY FL, LOAD RESONANCE RESISTANCE RL AND THE CALCULATION OF OTHER DERIVED VALUES OF QUARTZ CRYSTAL UNITS UP TO 30 MHZ
I.S. EN 60122-1:2002 AMD 1 2018	QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
EN 60122-1:2002/A1:2018	QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION (IEC 60122-1:2002/A1:2017)