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IEC 60758:2016

IEC 60758:2016

Current

Current

The latest, up-to-date edition.

Synthetic quartz crystal - Specifications and guidelines for use

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English, English - French

Published date

05-18-2016

Publisher

International Electrotechnical Committee

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Specification for synthetic quartz
  crystal
5 Specification for lumbered synthetic
  quartz crystal
6 Inspection rule for synthetic quartz
  crystal and lumbered synthetic quartz
  crystal
7 Guidelines for the use of synthetic quartz
  crystal for piezoelectric applications
Annex A (informative) - Frequently used sampling
        procedures
Annex B (informative) - Numerical example
Annex C (informative) - Example of reference
        sample selection
Annex D (informative) - Explanations of point
        callipers
Annex E (informative) - Infrared absorbance alpha
        value compensation
Annex F (informative) - Differences of the orthogonal
        axial system for quartz between IEC standard
        and IEEE standard
Annex G (informative) - alpha value measurement
        consistency between dispersive infrared spectrometer
        and fourier transform infrared spectrometer
Bibliography

IEC 60758:2016 applies to synthetic quartz single crystals intended for manufacturing piezoelectric elements for frequency control, selection and optical applications. This edition includes the following significant technical changes with respect to the previous edition:
- order rearrangement and review of terms and definitions;
- abolition as a standard of the infrared absorbance coefficient α3410;
- addition of the value measurement explanation by FT-IR equipment in annex;
- addition of the synthetic quartz crystal standards for optical applications.

Committee
TC 49
DevelopmentNote
Supersedes 91/28919 DC. (07/2004) Stability date: 2020. (05/2016)
DocumentType
Standard
Pages
60
PublisherName
International Electrotechnical Committee
Status
Current
Supersedes

IEC 63041-2:2017 Piezoelectric sensors - Part 2: Chemical and biochemical sensors
09/30207175 DC : 0 BS EN 62276 - SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATIONS - SPECIFICATIONS AND MEASURING METHOD
PD IEC/PAS 62276:2002 Single crystal wafers applied for surface acoustic wave device. Specification and measuring method
04/30111604 DC : 0 IEC 61994-4-4 ED.1 - PIEZOELECTRIC AND DIELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION GLOSSARY - PART 4-4: MATERIALS FOR SAW DEVICES
DD IEC/TS 61994-4-1:2007 Piezoelectric and dielectric devices for frequency control and selection. Glossary Piezoelectric materials. Synthetic quartz crystal
EN IEC 63041-2:2018 Piezoelectric Sensors - Part 2: Chemical and Biochemical Sensors
I.S. EN IEC 63041-1:2018 PIEZOELECTRIC SENSORS - PART 1: GENERIC SPECIFICATIONS
15/30318551 DC : 0 BS EN 62276 ED. 3.0 - SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATION - SPECIFICATIONS AND MEASURING METHODS
CEI EN 62276 : 2013 SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATIONS - SPECIFICATIONS AND MEASURING METHODS
EN IEC 63041-1:2018 Piezoelectric sensors - Part 1: Generic specifications
IEC 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
I.S. EN IEC 63041-2:2018 PIEZOELECTRIC SENSORS - PART 2: CHEMICAL AND BIOCHEMICAL SENSORS
IEC 63041-1:2017 Piezoelectric sensors - Part 1: Generic specifications
00/201812 DC : DRAFT APR 2000 IEC 61994-4-1 TS/ED. 1 - GLOSSARY FOR PIEZOELECTRIC AND DIELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - PART 4-1: SYNTHETIC QUARTZ CRYSTAL
03/108069 DC : DRAFT MAY 2003 IEC 62276 ED.1 - SINGLE CRYSTAL WAFERS APPLIED FOR SURFACE ACOUSTIC WAVE DEVICE - SPECIFICATION AND MEASURING METHOD
IEC PAS 62276:2001 Single crystal wafers applied for surface acoustic wave device - Specification and measuring method
BS EN 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
I.S. EN 62276:2016 SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATIONS - SPECIFICATIONS AND MEASURING METHODS
EN 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
IEC TS 61994-4-1:2007 Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal

IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
ISO 15368:2001 Optics and optical instruments Measurement of reflectance of plane surfaces and transmittance of plane parallel elements
IEC 60410:1973 Sampling plans and procedures for inspection by attributes
IEC 60122-2:1983 Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection
IEC 60122-1:2002 Quartz crystal units of assessed quality - Part 1: Generic specification

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Hardcopy - English
PDF - English
PDF 3 Users - English
PDF 5 Users - English
PDF 9 Users - English
Hardcopy - English - French
PDF - English - French
PDF 3 Users - English - French
PDF 5 Users - English - French
PDF 9 Users - English - French
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