Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

Published date

12-09-2016

Publisher

European Committee for Standards - Electrical

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Requirements
5 Sampling plan
6 Test methods
7 Identification, labelling, packaging, delivery condition
8 Measurement of Curie temperature
9 Measurement of lattice constant (Bond method)
10 Measurement of face angle by X-ray
11 Measurement of bulk resistivity
12 Visual inspections - Front surface inspection method
Annex A (normative) - Expression using Euler angle
        description for piezoelectric single crystals
Annex B (informative) - Manufacturing process
        for SAW wafers
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

IEC 62276:2012 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators. This edition includes the following significant technical changes with respect to the previous edition: - terms and definitions are rearranged in accordance with the alphabetical order; - 'reduced LN' is appended to terms and definitions; - 'reduced LT' is appended to terms and definitions; - reduction process is appended to terms and definitions.

Committee	CLC/SR 49
DocumentType	Standard
PublisherName	European Committee for Standards - Electrical
Status	Current

Standards	Relationship
I.S. EN 62276:2016	Identical
DIN EN 62276:2015-04 (Draft)	Identical
BS EN 62276:2016	Identical
NF EN 62276 : 2013	Identical
UNE-EN 62276:2016	Identical
IEC 62276:2016	Identical
PN EN 62276 : 2017	Identical
NEN EN IEC 62276 : 2016	Identical
CEI EN 62276 : 2013	Identical
SN EN 62276 : 2016	Identical
NBN EN 62276 : 2013	Identical
UNE-EN 62276:2013	Identical

EN ISO 4287:1998/A1:2009	GEOMETRICAL PRODUCT SPECIFICATIONS (GPS) - SURFACE TEXTURE: PROFILE METHOD - TERMS, DEFINITIONS AND SURFACE TEXTURE PARAMETERS
ISO 4287:1997	Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters
EN 61019-1 : 2005	Surface acoustic wave (SAW) resonators - Part 1: Generic specification
IEC 61019-1:2004	Surface acoustic wave (SAW) resonators - Part 1: Generic specification
EN 61019-2:2005	Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
IEC 60862-1:2015	Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
IEC 60758:2016	Synthetic quartz crystal - Specifications and guidelines for use
IEC 61019-2:2005	Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
IEC 60862-2:2012	Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
IEC 60862-3:2003	Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines
EN 60758:2016	Synthetic quartz crystal - Specifications and guidelines for use
IEC 61019-3:1991	Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections