I.S. EN 153000:1998
Current
The latest, up-to-date edition.
DISCRETE PRESSURE CONTACT POWER SEMICONDUCTOR DEVICES (QUALIFICATION APPROVAL) (GENERIC SPECIFICATION)
Hardcopy , PDF
English
01-01-1998
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
1 General
2 Quality assessment procedures
3 Test and measurement procedures (general guidance)
Annex A General inspection requirements for rectifier
diodes and thyristors
Annex B Additional electrical test methods
Annex C Screening
Annex D Dimensions
Annex E Direction of applied forces for mechanical tests
Figures
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