Digital Test Interchange Format (DTIF)

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English

Published date

06-21-2012

Publisher

International Electrotechnical Committee

1. Overview
2. References
3. Definitions and acronyms
4. Data organization overview of the DTIF standard
environment
5. File specifications
6. Conformance
Annex A (informative) - Implementation overview
Annex B (informative) - DTIF dependency diagrams
Annex C (informative) - Example circuit
Annex D (informative) - IEEE List of Participants

IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following:
a) UUT Model;
b) Stimulus and Response;
c) Fault Dictionary;
d) Probe.

DevelopmentNote	Stability Date: 2015. (10/2012)
DocumentType	Standard
Pages	101
PublisherName	International Electrotechnical Committee
Status	Current

Standards	Relationship
NEN IEC 61445 : 2012	Identical
BS IEC 61445:2012	Identical

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IEC 61445:2012

Digital Test Interchange Format (DTIF)

Table of Contents

Abstract

General Product Information

International Equivalents

Category

Subcategory