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13/30261587 DC : 0

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

BS ISO 17862 - SURFACE CHEMICAL ANALYSIS - SECONDARY ION MASS SPECTROMETRY - LINEARITY OF INTENSITY SCALE IN SINGLE ION COUNTING TIME-OF-FLIGHT MASS ANALYSERS

Available format(s)

Hardcopy , PDF

Superseded date

12-31-2013

Language(s)

English

Foreword
Introduction
1 Scope
2 Symbols and abbreviations
3 Outline of method
4 Procedure for evaluating the intensity linearity
5 Interval for repeat measurements
Annex A (normative) - Computation of raster size, ion beam
        current, number of frames for analysis and counts per
        pulse
Annex B (normative) - Charge compensation setting
Annex C (normative) - Ion detector setting
Annex D (informative) - Instrumental factors affecting
        linearity
Bibliography

BS ISO 17862

Committee
CII/60
DocumentType
Draft
Pages
28
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

ISO 23830:2008 Surface chemical analysis — Secondary-ion mass spectrometry — Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
ISO 18116:2005 Surface chemical analysis — Guidelines for preparation and mounting of specimens for analysis
ISO 13084:2011 Surface chemical analysis Secondary-ion mass spectrometry Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer

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US$23.42
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