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ASTM F 1596 : 2015

Current

Current

The latest, up-to-date edition.

Standard Test Method for Exposure of a Membrane Switch or Printed Electronic Device to Temperature and Relative Humidity (Withdrawn 2024)

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

07-24-2015

1.1This test method covers a procedure for temperature and humidity cycling of a membrane switch or printed electronic device.

1.2This test method is performed to evaluate the properties of materials used in the construction of membrane switch or printed electronic assemblies as they are influenced by the absorption and diffusion of moisture and moisture vapor. This is an accelerated environmental test, accomplished by the continuous exposure of the test specimen to high relative humidity at an elevated temperature. Absorption of moisture by many materials results in swelling, which destroys their functional utility, causes loss of physical strength, and changes in other mechanical properties. Insulating materials which absorb moisture may suffer degradation of their electrical properties.

1.2.1Physical changes:

1.2.1.1Differential contraction or expansion rates or induced strain of dissimilar materials.

1.2.1.2Cracking of surface coatings.

1.2.1.3Leaking of sealed compartments.

1.2.1.4Deformation or fracture of components.

1.2.2Chemical changes:

1.2.2.1Separation of constituents.

1.2.2.2Failure of chemical agent protection.

1.2.3Electrical changes:

1.2.3.1Changes in electronic and electrical components.

1.2.3.2Electronic or mechanical failures due to rapid water of condensate formation.

1.2.3.3Excessive static electricity.

1.3This test method is not intended to be a thermal shock procedure; a ramp rate between temperature extremes should not exceed 2°C/min.

1.4This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Committee
F 01
DocumentType
Test Method
Pages
3
PublisherName
American Society for Testing and Materials
Status
Current
Supersedes

ASTM F 1578 : 2007 : R2014 Standard Test Method for Contact Closure Cycling of a Membrane Switch (Withdrawn 2023)
ASTM F 1996 : 2014 Standard Test Method for Silver Migration for Membrane Switch Circuitry (Withdrawn 2023)

ASTM F 1661 : 2009 : R2015 Standard Test Method for Determining the Contact Bounce Time of a Membrane Switch (Withdrawn 2024)
ASTM F 1661 : 2009 Standard Test Method for Determining the Contact Bounce Time of a Membrane Switch
ASTM F 1663 : 2015 Standard Test Method for Determining the Capacitance of a Membrane Switch or Printed Electronic Device (Withdrawn 2024)
ASTM F 1689 : 2005 Standard Test Method for Determining the Insulation Resistance of a Membrane Switch
ASTM F 1663 : 2009 Standard Test Method for Determining the Capacitance of a Membrane Switch
ASTM F 2592 : 2007 : REV A Standard Test Method for Measuring the Force-Displacement of a Membrane Switch
ASTM F 1662 : 2010 Standard Test Method for Verifying the Specified Dielectric Withstand Voltage and Determining the Dielectric Breakdown Voltage of a Membrane Switch
ASTM F 2592 : 2016 Standard Test Method for Measuring the Force-Displacement of a Membrane Switch (Withdrawn 2023)
ASTM F 1595 : 2000 : R2005 Standard Practice for Viewing Conditions for Visual Inspection of Membrane Switches
ASTM F 1595 : 2000 : R2012 Standard Practice for Viewing Conditions for Visual Inspection of Membrane Switches
ASTM F 2592 : 2008 Standard Test Method for Measuring the Force-Displacement of a Membrane Switch
ASTM F 1661 : 2008 Standard Test Method for Determining the Contact Bounce Time of a Membrane Switch
ASTM F 1595 : 2000 Standard Practice for Viewing Conditions for Visual Inspection of Membrane Switches
ASTM F 1680 : 2007 : REV A Standard Test Method for Determining Circuit Resistance of a Membrane Switch
ASTM F 2592 : 2007 Standard Test Method for Measuring the Force-Displacement of a Membrane Switch
ASTM F 2592 : 2009 Standard Test Method for Measuring the Force-Displacement of a Membrane Switch
ASTM F 2592 : 2006 Standard Test Method for Measuring the Force-Displacement of a Membrane Switch
ASTM F 2592 : 2010 Standard Test Method for Measuring the Force-Displacement of a Membrane Switch
ASTM F 1661 : 1996 Standard Test Method for Determining the Contact Bounce Time of a Membrane Switch
ASTM F 1689 : 1996 Standard Test Method for Determining the Insulation Resistance of a Membrane Switch
ASTM F 1663 : 1995 Standard Test Method for Determining the Capacitance of a Membrane Switch
ASTM F 1662 : 1995 Standard Test Method for Verifying the Specified Dielectric Withstand Voltage of a Member Switch
ASTM F 1662 : 2003 Standard Test Method for Verifying the Specified Dielectric Withstand Voltage and Determining the Dielectric Breakdown Voltage of a Membrane Switch
ASTM F 1680 : 1996 Standard Test Method for Determining Circuit Resistance of a Membrane Switch
ASTM F 1662 : 2004 Standard Test Method for Verifying the Specified Dielectric Withstand Voltage and Determining the Dielectric Breakdown Voltage of a Membrane Switch
ASTM F 1680 : 2007 Standard Test Method for Determining Circuit Resistance of a Membrane Switch
ASTM F 1662 : 2016 Standard Test Method for Verifying the Specified Dielectric Withstand Voltage and Determining the Dielectric Breakdown Voltage of a Membrane Switch or Printed Electronic Device (Withdrawn 2023)
ASTM F 1595 : 2000 : R2020 Standard Practice for Viewing Conditions for Visual Inspection of Membrane Switches (Withdrawn 2023)
ASTM F 1680 : 2002 Standard Test Method for Determining Circuit Resistance of a Membrane Switch
ASTM F 1689 : 2002 Standard Test Method for Determining the Insulation Resistance of a Membrane Switch
ASTM F 1680 : 2007 : REV A : R2014 Standard Test Method for Determining Circuit Resistance of a Membrane Switch (Withdrawn 2023)
ASTM F 1689 : 2005 : R2020 Standard Test Method for Determining the Insulation Resistance of a Membrane Switch (Withdrawn 2023)
ASTM F 1689 : 2005 : R2012 Standard Test Method for Determining the Insulation Resistance of a Membrane Switch

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