Standard Test Method for Silver Migration for Membrane Switch Circuitry (Withdrawn 2023)

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

11-13-2014

Publisher

American Society for Testing and Materials

1.1This test method is used to determine the susceptibility of a membrane switch to the migration of the silver between circuit traces under dc voltage potential.

1.2Silver migration will occur when special conditions of moisture and electrical energy are present.

Committee	F 01
DocumentType	Test Method
Pages	3
PublisherName	American Society for Testing and Materials
Status	Current
Supersedes	ASTM F 1996 : 2006

ASTM F 1596 : 2015	Standard Test Method for Exposure of a Membrane Switch or Printed Electronic Device to Temperature and Relative Humidity (Withdrawn 2024)
ASTM F 1689 : 2005	Standard Test Method for Determining the Insulation Resistance of a Membrane Switch
ASTM F 1596 : 2000 : R2005	Standard Practice for Exposure of Membrane Switches to Temperature and Relative Humidity
ASTM F 1596 : 2007	Standard Test Method for Exposure of Membrane Switches to Temperature and Relative Humidity
ASTM F 1596 : 2000	Standard Practice for Exposure of Membrane Switches to Temperature and Relative Humidity
ASTM F 1689 : 1996	Standard Test Method for Determining the Insulation Resistance of a Membrane Switch
ASTM F 1689 : 2002	Standard Test Method for Determining the Insulation Resistance of a Membrane Switch
ASTM F 1689 : 2005 : R2012	Standard Test Method for Determining the Insulation Resistance of a Membrane Switch