ASTM F 487 : 2013

Name: ASTM F 487 : 2013
Brand: ASTM
Price: 66.00 USD

Superseded

View Superseded by

Standard Specification for Fine Aluminum–1 % Silicon Wire for Semiconductor Lead-Bonding

Available format(s)

Hardcopy , PDF

Superseded date

01-12-2024

Language(s)

English

Published date

01-01-2013

Publisher

American Society for Testing and Materials

CONTAINED IN VOL. 10.04, 2018 Defines aluminum - 1% silicon alloy wire for internal connections in semiconductor devices and is limited to wire of diameter up to and including 76 [mu]m (0.003 in.).

1.1This specification covers aluminum–1 % silicon alloy wire for internal connections in semiconductor devices and is limited to wire of diameter up to and including 76 μm (0.003 in.). For diameters larger than 76 μm (0.003 in.), the specifications are to be agreed upon between the purchaser and the supplier.

1.2The values stated in SI units are to be regarded as the standard, regardless of whether they appear first or second in a table. Values given in parentheses are for information only.

Committee	F 01
DocumentType	Standard
Pages	4
ProductNote	Reconfirmed 2013
PublisherName	American Society for Testing and Materials
Status	Superseded
SupersededBy	ASTM F 487 : 2013 : R2018
Supersedes	ASTM F 487 : 1988 : R2006

ASTM F 219 : 1996	Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps
MIL-STD-105 Revision E:1989	SAMPLING PROCEDURES AND TABLES FOR INSPECTION BY ATTRIBUTES