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BS QC 750112:1988

BS QC 750112:1988

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for single-gate field-effect transistors, up to 5 W and 1 GHz

Available format(s)

Hardcopy , PDF

Withdrawn date

04-25-2012

Language(s)

English

Published date

12-15-1988

Publisher

British Standards Institution

NO CONTENTS SECTION

Forms part of the IEC Quality Assessment System for electronic components. It refers to discrete semiconductor devices and specifies quality assessment, test and measurement procedures. Deals with field effect transistors.

Committee
EPL/47
DevelopmentNote
Also numbered as IEC 60747-8-1 (08/2005)
DocumentType
Standard
Pages
20
PublisherName
British Standards Institution
Status
Withdrawn

BS QC 750106:1993 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Field-effect transistors for case-rated power amplifier applications

BS 6493-3:1985 Semiconductor devices Mechanical and climatic test methods
BS 9970-0:1985 Harmonized system of quality assessment for electronic components. Semiconductor devices Generic specification
BS 3934:1965 Specification for dimensions of semiconductor devices and integrated electronic circuits
BS 6493-1.8:1985 Semiconductor devices. Discrete devices Recommendations for field-effect transistors
BS QC 750000(1986) : 1986 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - DISCRETE SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION

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Hardcopy - English
PDF - English
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