Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Field-effect transistors for case-rated power amplifier applications

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

07-15-1993

Publisher

British Standards Institution

Committee	EPL/47
DevelopmentNote	Also numbered as IEC 60747-8-2 (08/2005)
DocumentType	Standard
Pages	20
PublisherName	British Standards Institution
Status	Current

BS 6493-1.2:1984	Semiconductor devices. Discrete devices Recommendations for rectifier diodes
BS 6493-1.1:1984	Semiconductor devices. Discrete devices General
BS 6493-3:1985	Semiconductor devices Mechanical and climatic test methods
BS QC 750112:1988	Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for single-gate field-effect transistors, up to 5 W and 1 GHz
BS 6493-1.8:1985	Semiconductor devices. Discrete devices Recommendations for field-effect transistors
BS 3934-2(1992) : 1992 AMD 13374	MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES - SCHEDULE OF INTERNATIONAL DRAWINGS GIVING DIMENSIONS
BS QC700000(1991) : 1991	HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRIC COMPONENTS - GENERIC SPECIFICATION FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS
BS QC 750000(1986) : 1986	HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - DISCRETE SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION