Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear analogue-to-digital converters (ADC)

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

02-15-1994

Publisher

British Standards Institution

Committee	EPL/47
DevelopmentNote	Also numbered as IEC 60748-4-2 Supersedes 91/25082 DC (08/2005)
DocumentType	Standard
Pages	24
PublisherName	British Standards Institution
Status	Current

BS 6493-1.1:1984	Semiconductor devices. Discrete devices General
BS QC790100(1991) : 1991 AMD 10586	HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION FOR SEMICONDUCTOR INTEGRATED CIRCUITS EXCLUDING HYBRID CIRCUITS
BS 6493-2.1:1985	Semiconductor devices. Integrated circuits General
BS 6493-3:1985	Semiconductor devices Mechanical and climatic test methods
BS 6493-2.4(1989) : 1989	SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - RECOMMENDATIONS INTERFACE INTEGRATED CIRCUITS
BS QC 001002:1991	Rules of procedure of the IEC quality assessment system for electronic components (IECQ)
BS QC700000(1991) : 1991	HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRIC COMPONENTS - GENERIC SPECIFICATION FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS