Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification: integrated circuit static read/write memories

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

09-15-1993

Publisher

British Standards Institution

One of a series of blank detail specifications for semiconductor devices in the IECQ system.

Committee	EPL/47
DevelopmentNote	Also numbered as IEC 60748-2-8 Supersedes 88/20405 DC (08/2005)
DocumentType	Standard
Pages	18
PublisherName	British Standards Institution
Status	Current

IEC 60134:1961	Rating systems for electronic tubes and valves and analogous semiconductor devices
BS QC790100(1991) : 1991 AMD 10586	HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION FOR SEMICONDUCTOR INTEGRATED CIRCUITS EXCLUDING HYBRID CIRCUITS
BS 6493-3:1985	Semiconductor devices Mechanical and climatic test methods
BS QC 001002:1991	Rules of procedure of the IEC quality assessment system for electronic components (IECQ)
BS QC700000(1991) : 1991	HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRIC COMPONENTS - GENERIC SPECIFICATION FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS