CECC 30000 : 83 AMD 8
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
GENERIC SPECIFICATION: FIXED CAPACITORS
Superseded date
11-01-1993
Published date
01-12-2013
Publisher
Establishes standard terms, inspection procedures and methods of tests for use in sectional and detail specifications within the CECC System for electronic components. Coverage includes marking, voltage proof, impedance, bump, container sealing, vibration, climatic sequence, endurance, leakage current, drying, storage, surge, shear test, pressure relief, passive flammability, pressure relief, and rapid change of temperature.
| DevelopmentNote |
Also numbered as I.S. 569. (10/2002)
|
| DocumentType |
Standard
|
| PublisherName |
Cenelec Electronic Components Committee
|
| Status |
Superseded
|
| Standards | Relationship |
| DIN EN 130000 : 1994 AMD 10 1997 | Identical |
| BS EN 130000:1994 | Identical |
| NFC 83 100 : 1988 | Identical |
| BS E9070(1975) : LATEST | Identical |
| NBN C 83 100 : 1984 | Identical |
| BS CECC 30000:1984 | Identical |
| DEFSTAN 59-45(PT1)/3(1985) : 1985 | FILTERS AND NETWORKS OF ASSESSED QUALITY - PART 1: GENERAL REQUIREMENTS |
| BS CECC 31701:1988 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed capacitors for direct current with electrodes of thin metal foils and a polycarbonate film dielectric |
| I.S. 577:1992 | FIXED METALLIZED POLYCARBONATE FILM DIELECTRIC CAPACITORS FOR DIRECT CURRENT (BLANK DETAIL SPECIFICATION) |
| I.S. 1110:1991 | FIXED METALLIZED POLYETHYLENE-TEREPHTHALATE FILM DIELECTRIC SURFACE MOUNTING CAPACITORS FOR DIRECT CURRENT (DETAIL SPECIFICATION) |
| I.S. 529:1991 | FIXED CERAMIC CAPACITORS OF CERAMIC DIELECTRIC, CLASS 1 (SECTIONAL SPECIFICATION) |
| I.S. 530:1991 | FIXED CAPACITORS OF CERAMIC DIELECTRIC, CLASS 2 (SECTIONAL SPECIFICATION) |
| BS CECC 30901:1988 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed polystyrene film dielectric metal foil d.c. capacitors |
| BS CECC 30400:1984 | Harmonized system of quality assessment for electronic components. Sectional specification: fixed metallized polyethylene-terephthalate film dielectric capacitors for direct current |
| BS CECC 30101:1988 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed polyethylene-terephthalate film dielectric metal foil capacitors for direct current |
| BS CECC 30100:1986 | Harmonized system of quality assessment for electronic components. Sectional specification: fixed polyethylene terephthalate film dielectric metal foil capacitors for direct current |
| BS CECC 30900:1986 | Harmonized system of quality assessment for electronic components. Sectional specification: fixed polystyrene film dielectric metal foil d.c. capacitors |
| BS CECC 31801:1988 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed polypropylene film dielectric metal foil d.c. capacitors |
| 93/200044 DC : 0 | PREN 132600 - SECTIONAL SPECIFICATION - SURFACE MOUNTED MICA CAPACITORS - QUALIFICATION APPROVAL |
| 93/200045 DC : 0 | PREN 132601 - BLANK DETAIL SPECIFICATION - SURFACE MOUNTED MICA CAPACITORS - QUALIFICATION APPROVAL |
| I.S. 1117:1991 | FIXED POLYETHYLENE-TEREPHTHALATE FILM DIELECTRIC METAL FOIL CAPACITORS FOR DIRECT CURRENT (DETAIL SPECIFICATION) |
| BS CECC 30501:1978 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed metallized polycarbonate film dielectric d.c. capacitors |
| I.S. 1099:1991 | DETAIL SPECIFICATION - FIXED TANTALUM CAPACITORS WITH SOLID ELECTROLYTE, POROUS ANODE (SUB-FAMILY 3) |
| CECC 30201-803 : 1989 AMD 2 1991 | DETAIL SPECIFICATION - FIXED TANTALUM CAPACITORS WITH SOLID ELECTROLYTE, POROUS ANODE (SUB-FAMILY 3) |
| I.S. 580:1991 | TANTALUM SURFACE MOUNT CAPACITORS (BLANK DETAIL SPECIFICATION) |
| BS CECC 30301:1977 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: aluminium electrolytic capacitors with non-solid electrolyte |
| BS CECC 30801:1981 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: tantalum chip capacitors |
| BS CECC 31200:1981 | Harmonized system of quality assessment for electronic components: sectional specification: fixed capacitors with metallized electrodes and polypropylene dielectric |
| BS CECC 30300:1978 | Harmonized system of quality assessment for electronic components. Sectional specification: aluminium electrolytic capacitors |
| I.S. 1126:1993 | FIXED TANTALUM SURFACE MOUNTING CAPACITORS WITH SOLID ELECTROLYTE, POROUS ANODE (DETAILED SPECIFICATION) |
| BS CECC 31700:1986 | Harmonized system of quality assessment for electronic components. Sectional specification: fixed capacitors for direct current with electrodes of thin metal foils and a polycarbonate film dielectric |
| BS CECC 30701:1980 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed ceramic dielectric capacitors, class 2 |
| I.S. 1098:1991 | BLANK DETAIL SPECIFICATION - FIXED MULTILAYER CERAMIC CHIP CAPACITORS |
| BS CECC 32100:1992 | Harmonized system of quality assessment for electronic components. Sectional specification: fixed multilayer ceramic chip capacitors |
| I.S. 1109:1991 | FIXED CAPACITORS OF CERAMIC DIELECTRIC, CLASS 2 (BLANK DETAIL SPECIFICATION) |
| I.S. 531:1991 | TANTALUM SURFACE MOUNTING CAPACITORS (SECTIONAL SPECIFICATION) (REVISION) |
| BS CECC 31800:1988 | Harmonized system of quality assessment for electronic components. Sectional specification: fixed polypropylene film dielectric metal foil d.c. capacitors |
| I.S. 1066:1993 | FIXED METALLIZED POLYETHYLENE-TEREPHTHALATE FILM DIELECTRIC CAPACITORS FOR DIRECT CURRENT (DETAILED SPECIFICATION) |
| BS CECC 30201:1988 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed tantalum capacitors with solid electrolyte, porous anode (sub-family 3) |
| BS CECC 30200:1986 | Harmonized system of quality assessment for electronic components. Sectional specification: fixed tantalum capacitors with non-solid or solid electrolyte |
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