ECMA 274 : 2ED 99

Section 1 - General
1 Scope
2 Conformance
   2.1 Optical Disk
   2.2 Generating system
   2.3 Receiving system
   2.4 Compatibility statement
3 Reference
4 Definitions
   4.1 Alternating Fine Clock Mark (AFCM)
   4.2 Channel bit
   4.3 Clamping Zone
   4.4 Digital Sum Value (DSV)
   4.5 Disk Reference Plane
   4.6 dummy substrate
   4.7 entrance surface
   4.8 field
   4.9 interleaving
   4.10 land and groove
   4.11 mark
   4.12 phase change
   4.13 Physical Sector
   4.14 recording layer
   4.15 Reed-Solomon code (RS)
   4.16 segment number
   4.17 space
   4.18 substrate
   4.19 track
   4.20 track number
   4.21 track pitch
   4.22 wobble
   4.23 zone
5 Conventions and notations
   5.1 Representation of numbers
   5.2 Names
6 List of acronyms
7 General description of the optical disk
8 General Requirements
   8.1 Environments
        8.1.1 Test environment
        8.1.2 Operating environment
        8.1.3 Storage environment
        8.1.4 Transportation
   8.2 Safety requirements
   8.3 Flammability
9 Reference Drive
   9.1 Optical system
   9.2 Optical beam
   9.3 Read channel 1
   9.4 Disk clamping
   9.5 Rotation of the disk
   9.6 Tracking channel (Read channel 2)
        9.6.1 Normalized servo transfer function
        9.6.2 Reference Servo for Axial Tracking
        9.6.3 Reference Servo for Radial Tracking
Section 2 - Dimensional, mechanical and physical
            characteristics of the disk
10 Dimensional characteristics
   10.1 Reference Planes
   10.2 Overall dimensions
   10.3 First transition area
   10.4 Second transition area
   10.5 Clamping Zone
   10.6 Third transition area
   10.7 Information Zone
   10.8 Rim area
   10.9 Remark on tolerances
11 Mechanical characteristics
   11.1 Mass
   11.2 Moment of inertia
   11.3 Dynamic imbalance
   11.4 Axial runout
   11.5 Radial runout
12 Optical characteristics
   12.1 Index of refraction
   12.2 Thickness of the substrate
   12.3 Reflectivity
   12.4 Birefringence
   12.5 Angular deviation
Section 3 - Format of information
13 Data format
   13.1 Data Frames
        13.1.1 Identification Data (ID)
        13.1.2 ID Error Detection Code (IED)
        13.1.3 RSV
        13.1.4 Error Detection Code (EDC)
   13.2 Scrambled Frames
   13.3 ECC Blocks
   13.4 Recording Frames
   13.5 Modulation and NRZI conversion
   13.6 Physical Sectors
   13.7 Layout of a Recording Unit Block (RUB)
        13.7.1 Sync Frames used for linking
        13.7.2 Start Position Shift (SPS)
        13.7.3 Recording Unit Block position
   13.8 d.c. component suppression control
14 Track format
   14.1 Track shape
   14.2 Track path
   14.3 Track pitch
   14.4 Track number
   14.5 Track layout
        14.5.1 Segment layout
        14.5.2 AFCMs
Section 4 - Format of the Information Zone
15 General description of the Information Zone
16 Layout of the Information Zone
   16.1 Physical Sector Numbers (PSNs)
17 Lead-in Zone
   17.1 Initial Zone
   17.2 Reference Code Zone
   17.3 Buffer Zone 1
   17.4 Control Data Zone
         17.4.1 Physical format information
         17.4.2 Disk manufacturing information
         17.4.3 Content provider information
   17.5 Buffer Zone 2
   17.6 Connection Zone
   17.7 Guard Zone 1
   17.8 Inner Disk Test Zone
   17.9 Inner Drive Test Zone
   17.10 Guard Zone 2
   17.11 DMA Zone 1
   17.12 Inner Disk Identification Zone
   17.13 DMA Zone 2
18 Data Zone
19 Lead-out Zone
   19.1 DMA Zone 3
   19.2 Outer Disk Identification Zone
   19.3 DMA Zone 4
   19.4 Guard Zone 3
   19.5 Outer Drive Test Zone
   19.6 Outer Disk Test Zone
   19.7 Guard Zone 4
20 The use of the Defect Management Areas
   20.1 Defect Management Areas
   20.2 Primary Defect List (PDL)
   20.3 Secondary Defect List (SDL)
   20.4 Assignment of Logical Sector Numbers (LSNs)
   20.5 Slipping and Linear Replacement algorithms and
        requirements
21 Disk Control ECC Blocks (DCBs)
   21.1 Format of Disk Control ECC Blocks
Section 5 - Characteristics of the groove
22 General
23 Method of testing
   23.1 Environment
   23.2 Reference Drive
        23.2.1 Optics and mechanics
        23.2.2 Read power
        23.2.3 Read channels
        23.2.4 Tracking
   23.3 Definition of signals
24 Characteristics of the groove signals
   24.1 Push-pull signal
   24.2 Track Cross signal
   24.3 Phase depth
   24.4 Normalized wobble signal
   24.5 Characteristics of the wobble
   24.6 Characteristics of the Alternating Fine Clock Marks
        (AFCM)
25 Method of testing
   25.1 Environment
   25.2 Reference Drive
        25.2.1 Optics and mechanics
        25.2.2 Read power
        25.2.3 Read channels
        25.2.4 Tracking
        25.2.5 Scanning velocity
   25.3 Write conditions for Rewritable area
        25.3.1 Write pulse waveform
        25.3.2 Write power
        25.3.3 Measurement conditions
   25.4 Jitter
   25.5 Channel bit length
   25.6 Phase depth
   25.7 Definition of signals
        25.7.1 High frequency signals (HF)
        25.7.2 Modulated amplitude
        25.7.3 Reflectivity-modulation product
        25.7.4 Signal asymmetry
        25.7.5 Push-pull signal
        25.7.6 Track Cross signal
        25.7.7 Differential phase tracking error signal
Section 7 - Characteristics of user data
26 Method of testing
   26.1 Environment
   26.2 Reference Drive
        26.2.1 Optics and mechanics
        26.2.2 Read power
        26.2.3 Read channels
        26.2.4 Error correction
        26.2.5 Tracking
27 Minimum quality of a Recording Unit Block
   27.1 User-written data
   27.2 Embossed data
28 Data interchange requirements
   28.1 Tracking
   28.2 User-written data
   28.3 Quality of disk
Annex A - Measurement of light reflectivity
Annex B - Measurement of birefringence
Annex C - Measuring conditions for operation signal
Annex D - Measurement of the differential phase tracking
          error
Annex E - The write pulse wave form for testing
Annex F - 8-to-16 Modulation
Annex G - Optimum Power Control
Annex H - Logical to Physical address translation
Annex J - Recording Unit Block positioning
Annex K - Transportation
Annex L - Measurement of the groove wobble amplitude
Annex M - ADIP Encoding Process
Annex N - Values to be Implemented in Existing and Future
          Specifications