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I.S. EN 1071-4:2006

I.S. EN 1071-4:2006

Current

Current

The latest, up-to-date edition.

ADVANCED TECHNICAL CERAMICS - METHODS OF TEST FOR CERAMIC COATINGS - PART 4: DETERMINATION OF CHEMICAL COMPOSITION BY ELECTRON PROBE MICROANALYSIS (EPMA)

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2006

Publisher

National Standards Authority of Ireland

Preview

For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.

Foreword
1 Scope
2 Normative references
3 Terms and definitions
  3.1 General
  3.2 Terms used in electron probe microanalysis
4 Principle
5 Apparatus and materials
  5.1 General
  5.2 Scanning electron microscope
  5.3 Electron probe microanalyser
  5.4 Energy dispersive spectrometer
  5.5 Wavelength dispersive spectrometer
6 Preparation of test piece
  6.1 General
  6.2 Surface roughness
  6.3 Surface conduction
7 Test procedure
  7.1 General
  7.2 Instrument
  7.3 Analysis of thin coatings
  7.4 Analysis of thick coatings
  7.5 Analysis of multilayer coatings
8 Accuracy and interferences
9 Test report
Bibliography

Specifies methods for chemical analysis of ceramic coatings by means of electron probe microanalysis (EPMA) using a scanning electron microscope (SEM) or an electron probe microanalyser.

DevelopmentNote
Supersedes I.S. ENV 1071-4. (05/2006)
DocumentType
Standard
Pages
17
PublisherName
National Standards Authority of Ireland
Status
Current
Supersedes

Standards Relationship
EN 1071-4:2006 Identical
NF EN 1071-4 : 2006 Identical
NBN EN 1071-4 : 2006 Identical
SN EN 1071-4 : 2006 Identical
NEN EN 1071-4 : 2006 Identical
UNI EN 1071-4 : 2006 Identical
BS EN 1071-4:2006 Identical
NS EN 1071-4 : 1ED 2006 Identical
DIN EN 1071-4:2006-05 Identical

ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories
EN 623-4:2004 Advanced technical ceramics - Monolithic ceramics - General and textural properties - Part 4: Determination of surface roughness
ISO 14594:2014 Microbeam analysis Electron probe microanalysis Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
ISO 15632:2012 Microbeam analysis Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

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Hardcopy - English
PDF - English
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