I.S. EN IEC 60749-37:2022
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
11-20-2022
Publisher
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
DocumentType |
Standard
|
Pages |
58
|
PublisherName |
National Standards Authority of Ireland
|
Status |
Current
|
Supersedes |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.