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IEC 60747-12:1991

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

Semiconductor devices - Part 12: Sectional specification foroptoelectronic devices

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Withdrawn date

12-31-2021

Language(s)

English - French, Russian

Published date

09-15-1991

FOREWORD
Clause
1 Scope
2 General
  2.1 Related document
  2.2 Recommended values of temperatures (preferred
      values)
  2.3 Recommended values of voltages and currents
      (preferred values)
  2.4 Terminal identification
3 Quality assessment procedures
  3.1 Primary stage of manufacture and subcontracting
  3.2 Structurally similar devices
      3.2.1 Grouping for electrical and optical
            characteristic tests in Groups A and/or B
      3.2.2 Grouping for environmental and mechanical
            tests in Groups B and/or C
      3.2.3 Grouping for endurance tests
  3.3 Inspection requirements for qualification approval
  3.4 Quality conformance inspection
      3.4.1 Division into groups and sub-groups
            Table I - Group A: Lot by lot
            Table II - Group B: Lot by lot
            Table III - Group C: Periodic
  3.5 Group D tests
  3.6 Screening
      Table IV- Screening (under consideration)
  3.7 Sampling requirements
      Table V - Sampling requirements for Group A tests
      Table VI - Sampling requirements for Group B and C
                 tests, in which LTPD shall be used
4 Test and measurement procedures
  4.1 Light emitting diodes, infrared emitting diodes,
      general measurements
  4.2 Photocouplers
  4.3 Laser diodes
  4.4 Photodiodes and phototransistors
  4.5 Other devices (under consideration)
Appendix A - Structural similarity
Appendix B - Dimensions
Appendix C - Directions of applied forces for mechanical
             tests

Gives details of the quality assessment procedures, the inspectionrequirements, screening sequences, sampling requirements, test andmeasurement procedures required for semiconductor optoelectronicdevices. Applies to:-Semiconductor photo-emitters;opto-electronic displays;light-emitting diodes (LED);laser diodes.-Semiconductor photosensitive devices;photodiodes;phototransistors;photothyristors.-Semiconductor imaging devices.-Photocouplers, optocouplers.

Committee
TC 47
DocumentType
Standard
Pages
39
PublisherName
International Electrotechnical Committee
Status
Withdrawn

Standards Relationship
PN IEC 747-12 : 1997 Identical
BS QC 720100:1991 Identical

BS QC 720102:1997 Blank detail specification for laser diode modules with pigtail for fibre optic systems and subsystems
BS QC 720106:1997 Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for avalanche photodiodes (APDs) with/without pigtail, for fibre optic systems or subsystems
BS QC720101(1995) : 1995 DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION FOR LIGHT EMITTING/INFRARED EMITTING DIODES WITH/WITHOUT PIGTAIL FOR FIBRE OPTIC SYSTEMS AND SUB-SYSTEMS
UTEC 80 810 : 2005 RELIABILITY DATA HANDBOOK - UNIVERSAL MODEL FOR RELIABILITY PREDICTION OF ELECTRONICS COMPONENTS, PCBS AND EQUIPMENT
BS IEC 60747-12.1 : 1995 DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION FOR LIGHT EMITTING/INFRARED EMITTING DIODES WITH/WITHOUT PIGTAIL FOR FIBRE OPTIC SYSTEMS AND SUB-SYSTEMS
IEC 60747-12-2:1995 Semiconductor devices - Part 12: Optoelectronic devices - Section 2: Blank detail specification for laser diode modules with pigtail for fibre optic systems and sub-systems
BS QC 720104:1997 Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for pin-FET modules with/without pigtail, for fibre optic systems or subsystems
IEC 60747-12-1:1995 Semiconductor devices - Part 12: Optoelectronic devices - Section 1: Blank detail specification for light emitting/infrared emitting diodes with/without pigtail for fibre optic systems and sub-systems
IEC 61747-1:1998+AMD1:2003 CSV Liquid crystal and solid-state display devices - Part 1: Generic specification

IEC 60747-10:1991 Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits

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