BS IEC 60747-12.1 : 1995

Withdrawn

DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION FOR LIGHT EMITTING/INFRARED EMITTING DIODES WITH/WITHOUT PIGTAIL FOR FIBRE OPTIC SYSTEMS AND SUB-SYSTEMS

Available format(s)

Hardcopy , PDF

Withdrawn date

04-25-2012

Language(s)

English

Published date

01-01-1995

Publisher

British Standards Institution

Defines a quality assessment procedure that electronic components, released by one participating country, complying with the requirements of a specified application, is equally acceptable in all other participating countries without the need of further tests.

Committee	EPL/47/3
DevelopmentNote	Supersedes 92/04360 DC. Also numbered as BS QC720101(1995). (06/2005)
DocumentType	Standard
Pages	18
PublisherName	British Standards Institution
Status	Withdrawn
Supersedes	92/04360 DC : DRAFT DEC 1992

Standards	Relationship
IEC 60747-12-1:1995	Identical

IEC 60747-12:1991	Semiconductor devices - Part 12: Sectional specification foroptoelectronic devices
IEC 60747-10:1991	Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
BS QC 720100:1991	Harmonized system of quality assessment for electronic components. Semiconductor devices. Sectional specification for optoelectronic devices
BS QC700000(1991) : 1991	HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRIC COMPONENTS - GENERIC SPECIFICATION FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS