Name: IEEE 1671.4-2014
Brand: IEEE
Price: 130.68 USD

IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

04-30-2014

Publisher

Institute of Electrical & Electronics Engineers

1 Overview
2 Normative references
3 Definitions, acronyms, and abbreviations
4 TestConfiguration schema
5 TestConfiguration instance schema
6 ATML TestConfiguration XML schema names
  and locations
7 ATML XML schema extensibility
8 Conformance
Annex A (informative) - IEEE download web-site
        material associated with this document
Annex B (informative) - Test Configuration XML
        element mappings to MTPSI card fields
Annex C (informative) - Examples
Annex D (informative) - Bibliography

Describes an exchange format, utilizing XML, for identifying all of the hardware, software, and documentation that is needed to test and diagnose a UUT on an ATS.

Committee	SCC20 - Test and Diagnosis for Electronic Sys
DevelopmentNote	Also numbered as IEC 61671-4. (04/2016)
DocumentType	Standard
ISBN	978-0-7381-9022-8
Pages	54
PublisherName	Institute of Electrical & Electronics Engineers
Status	Current
Supersedes	IEEE 1671.4-2007

DEFSTAN 66-031(PT8)/2(2016) : 2016	REQUIREMENTS FOR ELECTRONIC AND ELECTRICAL TEST AND MEASUREMENT EQUIPMENT - PART 8: REQUIREMENTS FOR AUTOMATIC TEST SYSTEMS UTILISING AN OPEN SYSTEM ARCHITECTURE
DEFSTAN 00-52/4(2014) : 2014	THE GENERAL REQUIREMENTS FOR PRODUCT ACCEPTANCE AND MAINTENANCE TEST SPECIFICATIONS AND TEST SCHEDULES
IEC 61671:2012	Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
BS IEC 61671:2012	IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML
BS IEC 61636:2016	Software Interface for Maintenance Information Collection and Analysis (SIMICA)
IEC 61636:2016	Software interface for Maintenance Information Collection and Analysis (SIMICA)
IEEE/IEC 61671-4-2016	IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Configuration

IEEE 1671-2010	IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
MIL-STD-780 Revision G:1992	WORK UNIT CODES FOR AERONAUTICAL EQUIPMENT, UNIFORM NUMBERING SYSTEM

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IEEE 1671.4-2014

IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration

Table of Contents

Abstract

General Product Information

Standards Referenced By This Book

Standards Referencing This Book

Category

Subcategory