General test procedure of failure rate for electronic components

Available format(s)

Hardcopy , PDF

Language(s)

English, Japanese

Published date

07-31-1974

Publisher

Japanese Standards Association

This Japanese Industrial Standard is applicable to electronic components, hereinafter referred to as the "components", to be produced continuously, under essentially the same design, and established quality control, on which a certain failure rate, during expected life time can generally be assumed; and specifies procedure for the initial judgement, maintenance, principle of expansion measuring interval, number of samples, test period, disposal of obtained results, etc. to determine failure rate level of the components in accordance with the single sampling inspection system by attributes.

DocumentType	Standard
Pages	12
PublisherName	Japanese Standards Association
Status	Current

Reaffirmed 2014 1974(R2014) [20/10/2014]1974(R2009) [01/10/2009]1974(R1993) [01/02/1993]1974 [01/07/1974]

JIS C 5700:1974	General rules for reliability assured electronic components
JIS C 5260:1996	General rules of potentiometers for use in electronic equipment