OVE EN IEC 60749-10:2024 01 01
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods -- Part 10: Mechanical shock - Device and subassembly
Available format(s)
Hardcopy
Language(s)
English, German
Published date
01-01-2024
| Committee |
TC 47
|
| DocumentType |
Test Method
|
| Pages |
32
|
| ProductNote |
This standard also identical to IEC 60749-10:2022
|
| PublisherName |
Osterreichisches Normungsinstitut/Austrian Standards
|
| Status |
Current
|
| Supersedes |
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