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SAE
SAE J 1879 : 2014

SAE J 1879 : 2014

Current

Current

The latest, up-to-date edition.

HANDBOOK FOR ROBUSTNESS VALIDATION OF SEMICONDUCTOR DEVICES IN AUTOMOTIVE APPLICATIONS

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

02-21-2014

Publisher

SAE International

1. INTRODUCTION
2. SCOPE
3. TERMS, DEFINITIONS AND ABBREVIATIONS
4. ROBUSTNESS VALIDATION BASICS
5. MISSION PROFILE/VEHICLE REQUIREMENTS
6. TECHNOLOGY DEVELOPMENT
7. PRODUCT DEVELOPMENT
8. POTENTIAL RISKS AND FAILURE MECHANISMS
9. CREATION OF THE QUALIFICATION PLAN
10. STRESS AND CHARACTERIZATION
11. ROBUSTNESS ASSESSMENT
12. IMPROVEMENT
13. MONITORING
14. REPORTING AND KNOWLEDGE EXCHANGE
15. EXAMPLES
16. ANNEX KNOWLEDGE MATRIX
17. ANNEX REPORTING TEMPLATE
18. REFERENCES AND ADDITIONAL READING
19. NOTES

Specifies intrinsic reliability of electronic components for use in automotive electronics.

DocumentType
Revision
Pages
57
PublisherName
SAE International
Status
Current
Supersedes

SAE J 1850 : 2015 CLASS B DATA COMMUNICATIONS NETWORK INTERFACE
SAE J 1211 : 2012 HANDBOOK FOR ROBUSTNESS VALIDATION OF AUTOMOTIVE ELECTRICAL/ELECTRONIC MODULES
IEC TS 62686-1:2015 Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications - Part 1: General requirements for high reliability integrated circuits and discrete semiconductors
PD ISO/PAS 19451-2:2016 Application of ISO 26262:2011-2012 to semiconductors Application of hardware qualification
SAE J 1938 : 2015 PRODUCT DEVELOPMENT PROCESS AND CHECKLIST FOR VEHICLE ELECTRONIC SYSTEMS
ISO/PAS 19451-2:2016 Application of ISO 26262:2011-2012 to semiconductors Part 2: Application of hardware qualification
PD IEC/TS 62686-1:2015 Process management for avionics. Electronic components for aerospace, defence and high performance (ADHP) applications General requirements for high reliability integrated circuits and discrete semiconductors

ESD STM5.2 : 2012 ELECTROSTATIC DISCHARGE SENSITIVITY TESTING - MACHINE MODEL (MM) - COMPONENT LEVEL
ESD STM5.1 : 2007 ELECTROSTATIC DISCHARGE SENSITIVITY TESTING - HUMAN BODY MODEL (HBM) - COMPONENT LEVEL
ASTM F 617 : 2000 Standard Test Method for Measuring MOSFET Linear Threshold Voltage (Withdrawn 2006)
SAE J 1211 : 2012 HANDBOOK FOR ROBUSTNESS VALIDATION OF AUTOMOTIVE ELECTRICAL/ELECTRONIC MODULES
ESD STM5.3.1 : 1999 CHARGED DEVICE MODEL (CDM) - COMPONENT LEVEL
ISO 9001:2015 Quality management systems — Requirements
ASTM F 1096 : 1987 Method for Measuring Mosfet Saturated Threshold Voltage (Withdrawn 1992)
ASTM F 1260M : 1996 Standard Test Method for Estimating Electromigration Median Time-To-Failure and Sigma of Integrated Circuit Metallizations [Metric]
EIA 557 : 2006 STATISTICAL PROCESS CONTROL SYSTEMS

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