ASTM F 1260M : 1996
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
Standard Test Method for Estimating Electromigration Median Time-To-Failure and Sigma of Integrated Circuit Metallizations [Metric]
Hardcopy , PDF
11-11-2014
English
01-01-1996
CONTAINED IN VOL. 10.04, 2009 Aims to characterize the failure distribution of interconnect metallizations as used in microelectronic circuits and devices that fail due to electromigration under specified d.c. current density and temperature stress.
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