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SEMI D57:2023

Current

Current

The latest, up-to-date edition.

Guide for Definition of Measurement Index Visual Contrast Threshold (VCT) for Mura in FPD Image Quality Inspection

Available format(s)

Hardcopy

Language(s)

English

Published date

08-01-2023

Specific definitions and quantifications of Mura are not consistent for many FPD manufacturers.

DocumentType
Guide
Pages
0
PublisherName
Semiconductor Equipment & Materials Institute
Status
Current
Supersedes

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US$170.00
Excluding Tax where applicable

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