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SEMI G84 : 2003

SEMI G84 : 2003

Current

Current

The latest, up-to-date edition.

SPECIFICATION FOR STRIP MAP PROTOCOL

Published date

01-12-2013

Publisher

Semiconductor Equipment & Materials Institute

Provides a definition that will enable the implementation of strip mapping throughout the assembly and test process and will enable standardization of the strip map format and execution method throughout the factory floor.

DevelopmentNote
Not available for sale from ILI, customer to contact SEMI. (11/2001)
DocumentType
Standard
PublisherName
Semiconductor Equipment & Materials Institute
Status
Current

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