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SEMI MF1388 : 2007(R2018)

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

TEST METHOD FOR GENERATION LIFETIME AND GENERATION VELOCITY OF SILICON MATERIAL BY CAPACITANCE-TIME MEASUREMENTS OF METAL-OXIDE-SILICON (MOS) CAPACITORS

Superseded date

11-16-2023

Published date

08-04-2018

Covers the measurement of generation lifetime and generation velocity of silicon wafers. Also applies to semiconductor materials other than silicon and to insulators other than silicon dioxide, but the details of capacitor fabrication and the analyses and interpretation of data in such cases are not given in this test method.

DevelopmentNote
Not available for sale from ILI, customer to contact SEMI. (11/2003) Also available in CD-ROM. (11/2006)
DocumentType
Revision
PublisherName
Semiconductor Equipment & Materials Institute
Status
Superseded
SupersededBy

SEMI M1 : 2017 SPECIFICATION FOR POLISHED SINGLE CRYSTAL SILICON WAFERS
SEMI MF1535 : 2015 TEST METHOD FOR CARRIER RECOMBINATION LIFETIME IN ELECTRONIC-GRADE SILICON WAFERS BY NONCONTACT MEASUREMENT OF PHOTOCONDUCTIVITY DECAY BY MICROWAVE REFLECTANCE

SEMI M59 : 2014 TERMINOLOGY FOR SILICON TECHNOLOGY
SEMI MF1153 : 2010(R2015) TEST METHOD FOR CHARACTERIZATION OF METAL-OXIDE SILICON (MOS) STRUCTURES BY CAPACITANCE-VOLTAGE MEASUREMENTS

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