Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays)

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

31-01-1992

Publisher

British Standards Institution

Describes bipolar monolithic digital integrated circuit gates used in electronic components.

Committee	EPL/47
DocumentType	Standard
Pages	18
PublisherName	British Standards Institution
Status	Current

Standards	Relationship
IEC 60748-2-1:1991	Identical

BS QC790100(1991) : 1991 AMD 10586	HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION FOR SEMICONDUCTOR INTEGRATED CIRCUITS EXCLUDING HYBRID CIRCUITS
BS 6493-3:1985	Semiconductor devices Mechanical and climatic test methods
BS 6493-2.2(1986) : 1986	SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - RECOMMENDATIONS FOR DIGITAL INTEGRATED CIRCUITS
BS QC 001002:1991	Rules of procedure of the IEC quality assessment system for electronic components (IECQ)
BS QC700000(1991) : 1991	HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRIC COMPONENTS - GENERIC SPECIFICATION FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS