DIN EN 60749-13:2003-04

Superseded

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 13: SALT ATMOSPHERE

Available format(s)

Hardcopy , PDF

Superseded date

07-03-2021

Language(s)

German

Published date

01-01-2003

Publisher

German Institute for Standardisation (Deutsches Institut für Normung)

Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications

Gives a salt atmosphere test that determine the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices which specified for a marine environment.

DevelopmentNote	Supersedes DIN EN 60749. (06/2005) DRAFT 2017 issued in July 2017. (07/2017)
DocumentType	Standard
Pages	8
PublisherName	German Institute for Standardisation (Deutsches Institut für Normung)
Status	Superseded
Supersedes	DIN EN 60749:2002-09

Standards	Relationship
BS EN 60749-13:2002	Identical
I.S. EN 60749-13:2002	Identical
NBN EN 60749-13 : 2003	Identical
UNE-EN 60749-13:2003	Identical
IEC 60749-13:2002	Identical
NF EN 60749-13 : 2002	Identical
EN 60749-13:2002	Identical