EN 60749-13:2002

Superseded

View Superseded by

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

Superseded date

13-04-2018

Published date

16-08-2002

Publisher

European Committee for Standards - Electrical

Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) - Normative references to international
publications with their corresponding European
publications

Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.

Committee	CLC/SR 47
DevelopmentNote	Supersedes EN 60749. (06/2017) Redesignated as EN IEC 60749-13. (04/2018)
DocumentType	Standard
PublisherName	European Committee for Standards - Electrical
Status	Superseded
SupersededBy	EN IEC 60749-13:2018
Supersedes	EN 60749 : 99 AMD 2 2001

Standards	Relationship
NF EN 60749-13 : 2002	Identical
IEC 60749-13:2002	Identical
NBN EN 60749-13 : 2003	Identical
NEN EN IEC 60749-13 : 2002	Identical
I.S. EN 60749-13:2002	Identical
PN EN 60749-13 : 2004	Identical
UNE-EN 60749-13:2003	Identical
BS EN 60749-13:2002	Identical
CEI EN 60749-13 : 2004	Identical
DIN EN 60749-13:2003-04	Identical

IEC 60068-2-11:1981	Basic environmental testing procedures - Part 2-11: Tests - Test Ka: Salt mist
EN 60068-2-11:1999	Environmental testing - Part 2: Tests - Test Ka: Salt mist
IEC 60749-14:2003	Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)