Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)

Published date

20-06-2003

Publisher

European Committee for Standards - Electrical

FOREWORD
INTRODUCTION
1 Scope and object
2 Normative references
3 Test procedure

Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads.

Committee	CLC/SR 47
DocumentType	Standard
PublisherName	European Committee for Standards - Electrical
Status	Current
Supersedes	EN 60749 : 99 AMD 2 2001

Standards	Relationship
NF EN 60749-31 : 2003	Identical
IEC 60749-31:2002	Identical
NBN EN 60749-31 : 2004	Identical
NEN EN IEC 60749-31 : 2003	Identical
I.S. EN 60749-31:2003	Identical
PN EN 60749-31 : 2005	Identical
SN EN 60749-31 : 2003	Identical
UNE-EN 60749-31:2004	Identical
BS EN 60749-31:2003	Identical
CEI EN 60749-31 : 2004	Identical
DIN EN 60749-31:2003-12	Identical
BS EN 61073-1:2009	Identical

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EN 60749-31:2003

Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)

Table of Contents

Abstract

General Product Information

International Equivalents

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