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CENELEC
EN 61747-10-1:2013

EN 61747-10-1:2013

Current

Current

The latest, up-to-date edition.

Liquid crystal display devices - Part 10-1: Environmental, endurance and mechanical test methods – Mechanical

Published date

04-10-2013

Publisher

European Committee for Standards - Electrical

FOREWORD
1 Scope
2 Normative references
3 Terms, definitions and letter symbols
4 Standard atmospheric conditions for
  measurements and tests
5 Test methods
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

IEC 61747-10-1:2013 lists test methods applicable to liquid crystal display devices. It takes into account, wherever possible, the mechanical robustness test methods as outlined in IEC 60068. The object of this standard is to establish uniform preferred test methods with preferred values for stress levels for judging the mechanical properties of liquid crystal display devices. This first edition of IEC 61747-10-1 cancels and replaces Clauses 1 and 2 of the first edition of IEC 61747-5 published in 1998. This edition constitutes a technical revision.

Committee
CLC/SR 110
DevelopmentNote
Partially supersedes EN 61747-5. (10/2013)
DocumentType
Standard
PublisherName
European Committee for Standards - Electrical
Status
Current
Supersedes

BS EN 62922:2017 Organic light emitting diode (OLED) panels for general lighting. Performance requirements
EN 62922:2017 Organic light emitting diode (OLED) panels for general lighting - Performance Requirements

IEC 61747-1:1998+AMD1:2003 CSV Liquid crystal and solid-state display devices - Part 1: Generic specification
IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
EN 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
IEC 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
EN 61747-1:1999/A1:2003 LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES - PART 1: GENERIC SPECIFICATION
EN 60068-2-7:1993 Environmental testing - Part 2: Tests - Test Ga: Acceleration, steady state
EN 60068-2-27:2009 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
EN 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
EN 60068-2-6:2008 Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal)
IEC 61747-5-3:2009 Liquid crystal display devices - Part 5-3: Environmental, endurance and mechanical test methods - Glass strength and reliability
IEC 60749-14:2003 Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
EN 60749-14:2003 Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)

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