Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

Available format(s)

Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French

Published date

15-02-2018

Publisher

International Electrotechnical Committee

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Summary
Bibliography

IEC 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.
This edition includes the following significant technical changes with respect to the previous edition:
a) alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including information on conditioning and maintenance of the test chamber and mounting of test specimens (including explanatory figures).

Committee	TC 47
DevelopmentNote	Supersedes IEC PAS 62183 (08/2002) Supersedes IEC 60749. (03/2008) Stability Date: 2024. (02/2018)
DocumentType	Standard
Pages	28
PublisherName	International Electrotechnical Committee
Status	Current
Supersedes	IEC 60749-13:2002/COR1:2003 IEC 60749-13:2002

Standards	Relationship
CEI EN IEC 60749-13 : 2018	Identical
UNE-EN IEC 60749-13:2018	Identical
OVE EN IEC 60749-13: 2018 11 01	Identical
BS EN IEC 60749-13:2018	Identical
PN-EN IEC 60749-13:2018-11	Identical

MIL-STD-883 Revision K:2016	TEST METHOD STANDARD - MICROCIRCUITS
IEC 60749-14:2003	Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)

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IEC 60749-13:2018

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

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